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200-W GaN PA Design Based on Accurate Multicell Transistor Modeling
Vadala, V.; Raffo, A.; Bosi, G.; Barsegyan, A.; Custer, J.; Formicone, G.; Walker, J.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
IEEE MTT-S International Microwave Symposium Digest
Vol. 2022-, No. 1, pp: 378-381, Anno: 2022 |
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150-nm GaN HEMT Degradation under Realistic Load-Line Operation
Raffo, A.; Vadala, V.; Bosi, G.; Giofre, R.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2022 17th European Microwave Integrated Circuits Conference, EuMIC 2022
pp: 141-144, Anno: 2022 |
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mm-Wave GaN HEMT Technology: Advances, Experiments, and Analysis
Vadala, V.; Crupi, G.; Giofre, R.; Bosi, G.; Raffo, A.; Vannini, G.
dettagli >>
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IEEE Computer Society,
Mediterranean Microwave Symposium
Vol. 2022-, No. 1, pp: 420-425, Anno: 2022 |
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Evaluation of Microwave Transistor Degradation Using Low-Frequency Time-Domain Measurements
Bosi, G.; Vadala', V.; Giofre, R.; Raffo, A.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2021 34th General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2021
pp: 01-03, Anno: 2021 |
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Advanced Modelling Techniques Enabling E-Band Power Amplifier Design for 5G Backhauling
Vadala, V.; Raffo, A.; Colzani, A.; Fumagalli, M. A.; Sivverini, G.; Bosi, G.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference
pp: 161-164, Anno: 2021 |
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Empowering GaN-Si HEMT Nonlinear Modelling for Doherty Power Amplifier Design
Bosi, G.; Raffo, A.; Giofre, R.; Vadala, Valeria; Vannini, G.; Limiti, E.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
EuMIC 2020 - 2020 15th European Microwave Integrated Circuits Conference
pp: 249-252, Anno: 2021 |
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Advanced Measurement Techniques for Nonlinear Modelling of GaN HEMTs: From L-band to mm-Wave Applications
Vadalà, Valeria; Raffo, A.; Bosi, Gianni; Giofrè, Rocco; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2021 15th International Conference on Advanced Technologies, Systems and Services in Telecommunications, TELSIKS 2021 - Proceedings
pp: 63-69, Anno: 2021 |
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Nonlinear Characterization of GaN Transistors under Dynamic Bias Operation
Vadalà, Valeria; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2020 33rd General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2020
pp: 9232254-1-9232254-3, Anno: 2020 |
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Load-Pull Measurements Oriented to Harmonically-Tuned Power Amplifier Design
Bosi, Gianni; Raffo, Antonio; Vadalà, Valeria; Vannini, Giorgio; Avolio, Gustavo; Marchetti, Mauro; Giofre', Rocco; Colantonio, Paolo; Limiti, Ernesto
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMiC) - Proceedings
pp: 9160151-1-9160151-3, Anno: 2020 |
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GaN FET Load-Pull Data in Circuit Simulators: a Comparative Study
Avolio, G.; Raffo, A.; Marchetti, M.; Bosi, G.; Vadalà, V.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2019 14th European Microwave Integrated Circuits Conference (EuMIC)
pp: 80-83, Anno: 2019 |
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GaN HEMT Model with Enhanced Accuracy under Back-off Operation
Vadala', Valeria; Raffo, Antonio; Kikuchi, Ken; Yamamoto, Hiroshi; Bosi, Gianni; Inoue, Kazutaka; Ui, Norihiko; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2019 14th European Microwave Integrated Circuits Conference (EuMIC)
pp: 37-40, Anno: 2019 |
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An Ultra-Wideband Setup to Monitor Antenna-Impedance Variations in Low-Cost IoT Transmitters
Petrocchi, Alessandra; Raffo, A.; Bosi, G.; Vannini, G.; Yavuz Kapusuz, K.; Lemey, S.; Rogier, H.; Avolio, G.; Schreurs, D.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMIC 2018 - Proceedings
pp: 1-3, Anno: 2018 |
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Comparison of GaN HEMT Technology Processes by Large-Signal Low-Frequency Measurements
Kikuchi, Ken; Yamamoto, Hiroshi; Ui, Norihiko; Inoue, Kazutaka; Vadala', Valeria; Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMIC 2018 - Proceedings
pp: 8430002-1-8430002-3, Anno: 2018 |
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Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers
Yamamoto, Hiroshi; Kikuchi, Ken; Ui, Norihiko; Inoue, Kazutaka; Vadala, Valeria; Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
2018 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2018
pp: 44-47, Anno: 2018 |
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Evaluation of high-voltage transistor reliability under nonlinear dynamic operation
Bosi, Gianni; Raffo, Antonio; Vadala', Valeria; Trevisan, Francesco; Formicone, Gabriele; Burger, Jeff; Custer, James; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
Microwave Integrated Circuits Conference (EuMIC), 2017 12th European
pp: 248-251, Anno: 2017 |
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Extended operation of class-F power amplifiers using input waveform engineering
Cipriani, E.; Colantonio, P.; Giannini, F.; Raffo, A.; Vadala, V.; Bosi, G.; Vannini, G.
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
European Microwave Conference (EuMC), 2017 47th
pp: 144-147, Anno: 2017 |
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Thermal characterization of high-power GaN HEMTs up to 65 GHz
Petrocchi, Alessandra; Giovanni, Crupi; Vadala', Valeria; Gustavo, Avolio; Raffo, Antonio; Schreurs, Dominique M. M. -P.; Alina, Caddemi; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
Advanced Technologies, Systems and Services in Telecommunications (TELSIKS), 2017 13th International Conference on
pp: 162-165, Anno: 2017 |
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A GaN power amplifier for 100 VDC bus in GPS L-band
Formicone, G.; Burger, J.; Custer, J.; Veitschegger, W.; Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
Proceedings of the 2017 IEEE Topical Conference on Power Amplifiers for Wireless and Radio Applications, PAWR 2017
pp: 100-103, Anno: 2017 |
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Impact of transistor model uncertainty on microwave load-pull simulations
Bosi, Gianni; Raffo, Antonio; Vannini, Giorgio; Avolio, Gustavo; Schreurs, Dominique
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
I2MTC 2017 - 2017 IEEE International Instrumentation and Measurement Technology Conference, Proceedings
pp: 1-6, Anno: 2017 |
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75-VDC GaN technology investigation from a degradation perspective
Trevisan, Francesco; Raffo, Antonio; Bosi, Gianni; Vadala', Valeria; Vannini, Giorgio; Formicone, Gabriele; Burger, Jeff; Custer, James
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
Proceedings of the 2017 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2017
pp: 1-4, Anno: 2017 |
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